Effects of Mg on the electrical characteristics and thermal stability of Mgx Zn1-x O thin film transistors

Applied Physics Letters

Volumn 98, Issue 12, 2011, Pages

  Ku, Chieh Jen ^a   Duan, Ziqing ^a   Reyes, Pavel I ^a   Lu, Yicheng ^a   Xu, Yi ^b   Hsueh, Chien Lan ^b   Garfunkel, Eric ^b  

^a RUTGERS UNIVERSITY   (United States)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL DEVICE; ELECTRICAL CHARACTERISTIC; FIELD-EFFECT MOBILITIES; PURE ZNO; SUBTHRESHOLD SLOPE; THERMAL STABILITY;

OXYGEN; OXYGEN VACANCIES; THERMODYNAMIC STABILITY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

THIN FILM TRANSISTORS;

EID: 79953845463     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3567533     Document Type: Article

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