Application of atomic force microscopy in determining the fractal dimension of the mirror, mist, and hackle region of silica glass

Materials Characterization

Volumn 62, Issue 5, 2011, Pages 457-462

  Smith, R L ^a,b   Mecholsky Jr , J J ^a  

^a University of Florida   (United States)

^b NOVA SOUTHEASTERN UNIVERSITY   (United States)

Author keywords

Roughness exponent; Scanning probe microscopy; Slit island; Soda lime silica glass

Indexed keywords

BRITTLE MATERIALS; CRACK VELOCITIES; FRACTAL ANALYSIS; FRACTAL CHARACTERISTICS; FRACTAL DIMENSIONAL INCREMENT; FRACTURE SURFACES; ROUGHNESS EXPONENT; SILICA GLASS; SLIT-ISLAND; SODA-LIME-SILICA GLASS;

ATOMIC FORCE MICROSCOPY; BRITTLE FRACTURE; BRITTLENESS; CRACKS; FUSED SILICA; GLASS; HYDROGEN EMBRITTLEMENT; MIRRORS; PARTIAL DISCHARGES; SURFACES;

FRACTAL DIMENSION;

EID: 79953761264     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2011.03.001     Document Type: Article

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