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Volumn 365, Issue 1-3, 1999, Pages 168-172
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The dependence of fractal dimension on measuring conditions of scanning probe microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 8844284652
PISSN: 09370633
EISSN: None
Source Type: Journal
DOI: 10.1007/s002160051466 Document Type: Article |
Times cited : (47)
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References (7)
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