SCOPUS 정보 검색 플랫폼

Volumn 98, Issue 13, 2011, Pages

Low-frequency noise in junctionless multigate transistors

(8) Jang, Doyoung a,b,c Lee, Jae Woo b,c Lee, Chi Woo d Colinge, Jean Pierre d Mont̀s, Laurent b Lee, Jung Il a Kim, Gyu Tae c Ghibaudo, Ǵrard b

a Korea Institute of Science and Technology (South Korea)

b IMEP LAHC (France)

c Korea University (South Korea)

d UNIVERSITY COLLEGE CORK (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

BULK TRANSISTORS; CARRIER NUMBER FLUCTUATION; HOOGE MOBILITY FLUCTUATIONS; LOW-FREQUENCY NOISE; MULTIGATE TRANSISTORS; NANOWIRE DEVICES; SEMICONDUCTOR INTERFACES; TRAP DENSITY; TRAPPING CENTERS;

CARRIER MOBILITY; NANOWIRES; SILICON COMPOUNDS; THERMAL NOISE;

TRANSISTORS;

EID: 79953752216 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3569724 Document Type: Article

Times cited : (55)

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