Observation of a bent crystal-lattice by x-ray interferometry

Optics Express

Volumn 17, Issue 13, 2009, Pages 11172-11178

  Massa, Enrico ^a   Mana, Giovanni ^a   Ferroglio, Luca ^a,b  

^a ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS;

ATOMIC-SCALE RESOLUTION; CRYSTAL DEFORMATION; HIGHLY ACCURATE; PHASE CONTRASTS; PREDICTIVE CAPABILITIES; X-RAY INTERFEROMETERS; X-RAY INTERFEROMETRY; X-RAY TOPOGRAPHY;

FINITE ELEMENT METHOD;

SILICON;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT DESIGN; FINITE ELEMENT ANALYSIS; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; OPTICS; PHASE CONTRAST MICROSCOPY; REPRODUCIBILITY; STATISTICAL MODEL; X RAY; X RAY DIFFRACTION;

CRYSTALLIZATION; EQUIPMENT DESIGN; FINITE ELEMENT ANALYSIS; INTERFEROMETRY; MICROSCOPY, PHASE-CONTRAST; MODELS, STATISTICAL; OPTICS AND PHOTONICS; REPRODUCIBILITY OF RESULTS; SILICON; X-RAY DIFFRACTION; X-RAYS;

EID: 67649342901     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.011172     Document Type: Article

References (8)

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4. U. Bonse and W. Graeff, "X-ray and neutron interferometry," in: Topics in applied physics, 22 X-ray optics, applications to solids, H.-J. Queisser ed. (Berlin, Springer, 1997).
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7. L. Ferroglio, G. Mana, and E. Massa, "Si lattice parameter measurement by centimeter x-ray interferometry," Opt. Express 16, 16877-16888 (2008).
8. A. G. Every and A. K. Mc Curdy, Low Frequency Properties of Dielectric Crystals: Second and Higher Order Elastic Constants in: Landolt-Börnstein III/29a, Nelson, D. F. ed. (Springer, Berlin, 1992).