Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 17, Issue 1, 2001, Pages 29-36

  Aminian, Farzan ^a   Aminian, Mehran ^b  

^a TRINITY UNIVERSITY   (United States)

^b ST MARY'S UNIVERSITY   (United States)

Author keywords

Analog circuits; Analog fault diagnosis; Bayesiasn learning; Neural networks

Indexed keywords

COMPUTER SIMULATION; NEURAL NETWORKS; PROGRAM PROCESSORS; WAVELET TRANSFORMS;

FAULT DIAGNOSIS;

NETWORKS (CIRCUITS);

EID: 0035244599     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1011141724916     Document Type: Article

References (8)

1. Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
2. On the application of neural networks to fault diagnosis of electronic analog circuits
3. A practical Bayesian framework for back-propagation networks
4. Linear circuit fault diagnosis using neuromorphic analyzer