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Volumn 11, Issue 2, 2002, Pages 112-121

Genetically evolved neural networks for fault classification in analog circuits

Author keywords

Analog circuits; Fault classification; Fault grouping; Fault simulation; Genetic algorithms; Genetically evolved neural networks

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; GENETIC ALGORITHMS; INTEGRATED CIRCUITS;

EID: 0036027193     PISSN: 09410643     EISSN: None     Source Type: Journal    
DOI: 10.1007/s005210200023     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.