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Volumn 100, Issue 22, 2008, Pages
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Exponentially enhanced quantum metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
(001) PARAMETER;
AMERICAN PHYSICAL SOCIETY (APS);
APPLIED (CO);
N QUBITS;
QUANTUM METROLOGY;
UNITARY OPERATORS;
PARAMETER ESTIMATION;
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EID: 44949205344
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.100.220501 Document Type: Article |
Times cited : (180)
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References (14)
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