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Volumn 96, Issue 1, 2006, Pages

Quantum metrology

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMAL CONTROL SYSTEMS; PARAMETER ESTIMATION; PRECISION ENGINEERING; STATISTICAL METHODS;

EID: 32644465772     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.010401     Document Type: Article
Times cited : (2570)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.