Quantum metrology

Physical Review Letters

Volumn 96, Issue 1, 2006, Pages

  Giovannetti, Vittorio ^a   Lloyd, Seth ^b   MacCone, Lorenzo ^c  

^a INFM   (Italy)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMAL CONTROL SYSTEMS; PARAMETER ESTIMATION; PRECISION ENGINEERING; STATISTICAL METHODS;

CLASSICAL STRATEGIES; QUANTUM EFFECTS; QUANTUM METROLOGY; QUANTUM STRATEGIES;

QUANTUM THEORY;

EID: 32644465772     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.010401     Document Type: Article

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