Nonlinear metrology with a quantum interface

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Napolitano, M ^a   Mitchell, M W ^a  

^a ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PROPERTIES; COLLECTIVE SPIN; COLLECTIVE VARIABLES; CONTINUOUS VARIABLES; EFFECTIVE HAMILTONIAN; HEISENBERG LIMIT; METROLOGY SYSTEMS; MODEL HAMILTONIANS; NON-LINEAR ESTIMATION; QUANTUM ATOMS; QUANTUM INTERFACES; QUANTUM METROLOGY;

HAMILTONIANS; LIGHT; MEASUREMENTS; RUBIDIUM;

ATOMS;

EID: 77958531946     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/9/093016     Document Type: Article

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