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Volumn 50, Issue 3, 2011, Pages

Enhanced piezoelectric constant of (1-x)BiFeO3-xBiCoO 3 thin films grown on LaAlO3 substrate

(7) Nakamura, Yoshitaka a Kawai, Masanori a Azuma, Masaki a,c Kubota, Makoto b Shimada, Mikio b Aiba, Toshiaki b Shimakawa, Yuichi a

a KYOTO UNIVERSITY (Japan)

b CANON INC (Japan)

c TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTION DEPOSITION; CO SUBSTITUTION; PIEZOELECTRIC CONSTANT; RHOMBOHEDRAL PHASE; TETRAGONAL PHASE; TETRAGONAL STRUCTURE;

COBALT COMPOUNDS; LANTHANUM ALLOYS; PIEZOELECTRICITY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

BISMUTH COMPOUNDS;

EID: 79953123429 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.50.031505 Document Type: Article

Times cited : (25)

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