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Volumn 97, Issue 21, 2010, Pages

Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries

(5) Cheng, Ching Jung a Kan, Daisuke b,c Anbusathaiah, Varatharajan a Takeuchi, Ichiro b Nagarajan, Valanoor a

a UNIVERSITY OF NEW SOUTH WALES (Australia)

b UNIVERSITY OF MARYLAND (United States)

c KYOTO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BFO FILMS; DIELECTRIC CONSTANTS; ELECTROMECHANICAL PROPERTY; EPITAXIAL THIN FILMS; MORPHOTROPIC PHASE BOUNDARIES; NANO SCALE; NON-POLAR; ORTHORHOMBIC PHASE; PHASE CO-EXISTENCE; PIEZOELECTRIC COEFFICIENT; SELECTED AREA ELECTRON DIFFRACTION;

FERROELECTRIC FILMS; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY;

EPITAXIAL FILMS;

EID: 78649534451 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3520642 Document Type: Article

Times cited : (76)

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