Surface modified hydroxyapatite thick films for CO2 gas sensing application: Effect of swift heavy ion irradiation

Radiation Physics and Chemistry

Volumn 80, Issue 6, 2011, Pages 682-687

  Mene, Ravindra U ^a   Mahabole, Megha P ^a   Khairnar, Rajendra S ^a  

^a SWAMI RAMANAND TEERTH MARATHWADA UNIVERSITY   (India)

Author keywords

Gas sensor; Hydroxyapatite; Swift heavy ions (SHI) irradiation; Thick films

Indexed keywords

A-CARBON; CO2 GAS; CRYSTALLINITIES; DEVICE APPLICATION; FLUENCES; GAS RESPONSE; GAS SENSING; GAS SENSING PROPERTIES; GAS SENSORS; GAS UPTAKE; GRADUAL CHANGES; ION FLUENCES; MATRIX; MEV ENERGY; RECOVERY TIME; REPRODUCIBILITIES; SCREEN PRINTING TECHNIQUE; SENSOR CHARACTERISTICS; SHI IRRADIATION; SURFACE-MODIFIED; SWIFT HEAVY ION IRRADIATION; SWIFT HEAVY IONS; TEST GAS; TYPE STRUCTURES; WORKING TEMPERATURES; XRD;

AGGLOMERATION; APATITE; ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE; CARBON FILMS; CHEMICAL DETECTION; GAS DETECTORS; HEAVY IONS; HYDROXYAPATITE; IRRADIATION; SENSORS; THICK FILMS;

GASES;

CARBON DIOXIDE; HYDROXYAPATITE; SILVER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE TENSION; CONTROLLED STUDY; CRYSTALLIZATION; ELECTRON RADIATION; GAS ANALYSIS; GAS DIFFUSION; HEAVY ION RADIATION; HIGH TEMPERATURE PROCEDURES; NANOSENSOR; PRODUCT RECOVERY; RADIATION BEAM; RADIATION ENERGY; RADIATION EXPOSURE; REPRODUCIBILITY; SURFACE PROPERTY; TEMPERATURE SENSITIVITY; X RAY DIFFRACTION;

EID: 79953059958     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2011.02.002     Document Type: Article

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