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Applied Physics Letters

Volumn 98, Issue 11, 2011, Pages

Medium energy ion scattering of Gr on SiC(0001) and Si(100)

(6) Copel, M a Oida, S a Kasry, A b Bol, A A b Hannon, J B b Tromp, R M b

a IBM T J WATSON RESEARCH CENTER (United States)

b Egypt Nanotechnology Research Center (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY RESOLUTIONS; HIGH RESOLUTION; ION BEAM ANALYSIS; ISOTOPE LABELING; MEDIUM ENERGY ION SCATTERING; PRACTICAL METHOD; SI (100) SUBSTRATE; SI(1 0 0);

CHEMICAL ANALYSIS; CHEMICAL VAPOR DEPOSITION; DEPTH PROFILING; ETHYLENE; ISOTOPES; MONOLAYERS; SILICON CARBIDE;

GRAPHENE;

EID: 79952967736 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3565968 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.