High angle annular dark field imaging of stacking faults

Micron

Volumn 28, Issue 2, 1997, Pages 89-94

  Amali, A ^a   Rez, P ^a   Cowley, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030875192     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00001-2     Document Type: Article

References (20)

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