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Volumn 205, Issue 15, 2011, Pages 3923-3930

Layer formation by resputtering in Ti-Si-C hard coatings during large scale cathodic arc deposition

Author keywords

Cathodic arc; Hard coatings; Layer formation; Resputtering; Ternary cathodes

Indexed keywords

AS-DEPOSITED FILMS; CATHODIC ARC; CATHODIC ARC DEPOSITION; DEPOSITION FLUXES; ENERGY DISPERSIVE X-RAY SPECTROMETRY; HIGH INCIDENCE; INDUSTRIAL SCALE; LAYER FORMATION; LAYER THICKNESS; NANO-INDENTATION HARDNESS; NORMAL DIRECTION; PHYSICAL MECHANISM; RE-SPUTTERING; ROTATING SUBSTRATES; SI CONTENT; SUB-LAYERS; TERNARY CATHODES; TIC GRAINS;

EID: 79952734628     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.02.007     Document Type: Article
Times cited : (91)

References (30)
  • 14
    • 79952736278 scopus 로고    scopus 로고
    • PDF: TiC 00-032-1383, Ti 00-044-1294, ICDD "Powder Diffraction File
    • PDF: TiC 00-032-1383, Ti 00-044-1294, ICDD "Powder Diffraction File", 2008.
    • (2008)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.