Structure and morphology of coevaporated pentacene-perfluoropentacene thin films

Journal of Chemical Physics

Volumn 134, Issue 10, 2011, Pages

  Hinderhofer, A ^a   Frank, C ^b   Hosokai, T ^b   Resta, A ^b   Gerlach, A ^b   Schreiber, F ^b  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CO-EVAPORATED; COEVAPORATED THIN FILMS; DIFFRACTION ANALYSIS; GRAZING INCIDENCE X-RAY DIFFRACTION; HIGH GROWTH TEMPERATURES; LOW GROWTH TEMPERATURE; MOLECULAR PLANES; PENTACENES; PERFLUOROPENTACENES; RECIPROCAL SPACE MAPS; STRUCTURE AND MORPHOLOGY; TEMPERATURE DEPENDENT; THERMALLY STABLE; X RAY REFLECTIVITY;

DIFFRACTION; GROWTH TEMPERATURE; SILICON COMPOUNDS; THIN FILMS; TITRATION; X RAY DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 79952662451     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3557476     Document Type: Article

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