Deposition and characterization of layer-by-layer sputtered AgGaSe 2 thin films

Applied Surface Science

Volumn 257, Issue 13, 2011, Pages 5731-5738

  Karaagac, H ^a   Parlak, M ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Chalcopyrite compounds; Photoresponse; Scanning electron microscopy; Transmission reflection; X ray diffraction

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CHEMICAL ANALYSIS; COPPER COMPOUNDS; ENERGY GAP; GALLIUM COMPOUNDS; LAYERED SEMICONDUCTORS; LIME; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SILVER; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

CHALCOPYRITE COMPOUNDS; ENERGY DISPERSIVE ANALYSIS OF X-RAYS; LAYER BY LAYER DEPOSITION; PHOTORESPONSE MEASUREMENTS; PHOTORESPONSES; TEMPERATURE-DEPENDENT RESISTIVITY; TRANSMISSION REFLECTION; TRANSMITTANCE AND REFLECTANCES;

DEPOSITION;

EID: 79952534044     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.01.087     Document Type: Article

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