Structural and electrical properties of polycrystalline Ag xGa2-xSe2 (0.4≤ χ ≤1.6) thin films

Indian Journal of Pure and Applied Physics

Volumn 47, Issue 11, 2009, Pages 787-792

  Bhuiyan, M R A ^a   Saha, D K ^b   Hasan, S M Firoz ^b  

^a ISLAMIC UNIVERSITY   (Bangladesh)

^b ATOMIC ENERGY CENTER   (Bangladesh)

Author keywords

Ags thin films; Electrical properties; Sel technique; Structural properties; Thin films

Indexed keywords

EID: 76549106611     PISSN: 00195596     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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