Optical properties of polycrystalline AgxGa2-xSe2 (0.4≤x≤1.6) thin films

Solar Energy Materials and Solar Cells

Volumn 91, Issue 2-3, 2007, Pages 148-152

  Bhuiyan, M R A ^a   Firoz Hasan, S M ^b  

^a ISLAMIC UNIVERSITY   (Bangladesh)

^b ATOMIC ENERGY CENTER   (Bangladesh)

Author keywords

Composition; Optical properties; Polycrystalline thin films; SEL technique; Stoichiometry

Indexed keywords

DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; SPECTROPHOTOMETRY; STOICHIOMETRY; SUBSTRATES; X RAY DIFFRACTION;

MICROSTRUCTURAL PERFECTION; POLYCRYSTALLINE THIN FILMS; SEL TECHNIQUE;

THIN FILMS;

EID: 33751237383     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2006.07.010     Document Type: Article

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