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Thin Solid Films

Volumn 487, Issue 1-2, 2005, Pages 199-201

Preparation and photosensitivity investigation of n-GaSe/p-CuIn 3Se5 heterostructures

(5) Bodnar, I V a Victorov, I A b Kushner, T L e Rud', V Yu c Rud', Yu V d

a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS (Belarus)

b INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS (Belarus)

c PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY (Russian Federation)

d IOFFE INSTITUTE (Russian Federation)

e NONE

Author keywords

Composition; Heterojunctions; Photosensitive; X ray diffraction

Indexed keywords

COPPER COMPOUNDS; CRYSTALLIZATION; CURRENT VOLTAGE CHARACTERISTICS; PHOTOSENSITIVITY; SEMICONDUCTING GALLIUM COMPOUNDS; SILICON WAFERS; SINGLE CRYSTALS; STOICHIOMETRY; X RAY DIFFRACTION;

CURRENT FLOW; POLARIZED RADIATION; STOICHIOMETRIC RATIO; THIN WAFERS;

HETEROJUNCTIONS;

EID: 22944489180 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.01.064 Document Type: Conference Paper

Times cited : (10)

References (13)

1
- 0036808204
- I.V. Bodnar, V.Yu. Rud', Yu.V. Rud', and M.V. Yakushev Semiconductors 36 2002 1132
- (2002) Semiconductors , vol.36 , pp. 1132
- Bodnar, I.V.¹ Rud, V.Yu.² Rud, Yu.V.³ Yakushev, M.V.⁴

2
- 0002646107
- G. Marin, R. Marguez, R. Guewara, S.M. Wasim, J.M. Delgado, C. Rincon, G.S. Perez, I. Molina, and P. Bocaranda Jpn. J. Appl. Phys. 39 2000 44
- (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 44
- Marin, G.¹ Marguez, R.² Guewara, R.³ Wasim, S.M.⁴ Delgado, J.M.⁵ Rincon, C.⁶ Perez, G.S.⁷ Molina, I.⁸ Bocaranda, P.⁹

3
- 0034316923
- N. Kohara, S. Nishiawaki, T. Negami, and T. Wada Jpn. J. Appl. Phys. 39 2000 6316
- (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 6316
- Kohara, N.¹ Nishiawaki, S.² Negami, T.³ Wada, T.⁴

4
- 36449001509
- T. Negami, N. Kohara, N. Nishitani, T. Wada, and T. Hirao Appl. Phys. Lett. 67 1997 825
- (1997) Appl. Phys. Lett. , vol.67 , pp. 825
- Negami, T.¹ Kohara, N.² Nishitani, N.³ Wada, T.⁴ Hirao, T.⁵

5
- 6944250403
- S.B. Zhang, S.H. Wei, and A. Zunger Phys. Rev. Lett. 78 1997 4059
- (1997) Phys. Rev. Lett. , vol.78 , pp. 4059
- Zhang, S.B.¹ Wei, S.H.² Zunger, A.³

6
- 0000152090
- S.B. Zhang, S.H. Wei, A. Zunger, and H. Katayama-Yoshida Phys. Rev., B 57 1998 9642
- (1998) Phys. Rev., B , vol.57 , pp. 9642
- Zhang, S.B.¹ Wei, S.H.² Zunger, A.³ Katayama-Yoshida, H.⁴

7
- 0035504953
- C. Rincon, S.M. Wasim, G. Marin, R. Marguez, and G. Sanchez Perez J. Appl. Phys. 90 2001 4423
- (2001) J. Appl. Phys. , vol.90 , pp. 4423
- Rincon, C.¹ Wasim, S.M.² Marin, G.³ Marguez, R.⁴ Sanchez Perez, G.⁵

8
- 0041736362
- N.S. Orlova, I.V. Bodnar, and T.L. Kushner J. Phys. Chem. Solids 64 2003 1895
- (2003) J. Phys. Chem. Solids , vol.64 , pp. 1895
- Orlova, N.S.¹ Bodnar, I.V.² Kushner, T.L.³

9
- 33846191545
- S.C. Abrahams, and J.L. Bernstein J. Chem. Phys. 59 1973 5415
- (1973) J. Chem. Phys. , vol.59 , pp. 5415
- Abrahams, S.C.¹ Bernstein, J.L.²

10
- 2542546950
- I.V. Bodnar, N.S. Orlova, and I.N. Tserel'chuk Neorg. Mater. 31 1995 899
- (1995) Neorg. Mater. , vol.31 , pp. 899
- Bodnar, I.V.¹ Orlova, N.S.² Tserel'Chuk, I.N.³

11
- 0000214239
- I.V. Bodnar, V.Yu. Rud', and Yu.V. Rud' Cryst. Res. Technol. 31 1996 261
- (1996) Cryst. Res. Technol. , vol.31 , pp. 261
- Bodnar, I.V.¹ Rud, V.Yu.² Rud, Yu.V.³

12
- 0017998661
- N.M. Mektiev, Yu.V. Rud', and E.Yu. Salaev Semiconductors 12 1978 924
- (1978) Semiconductors , vol.12 , pp. 924
- Mektiev, N.M.¹ Rud, Yu.V.² Salaev, E.Yu.³

13
- 1542534309
- I.V. Bodnar, T.L. Kushner, V.Yu. Rud', and Yu.V. Rud' Zh. Prikl. Spectrosk. 69 2002 519
- (2002) Zh. Prikl. Spectrosk. , vol.69 , pp. 519
- Bodnar, I.V.¹ Kushner, T.L.² Rud, V.Yu.³ Rud, Yu.V.⁴

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