SCOPUS 정보 검색 플랫폼

Microelectronic Engineering

Volumn 88, Issue 5, 2011, Pages 593-596

Thermoelectric properties of n-type Bi-Te thin films with various compositions

(4) Lee, H J a Hyun, S a Park, H S a Han, S W a

a Korea Institute of Machine and Materials (South Korea)

Author keywords

Bi Te; Combinatorial method; RF co sputtering; Thermoelectric thin film

Indexed keywords

BI-TE; BISMUTH-TELLURIDE; COMBINATORIAL METHOD; COSPUTTERING; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MAXIMUM POWER FACTOR; POST ANNEALING; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; SEM; SINGLE WAFER; THERMOELECTRIC PROPERTIES; THERMOELECTRIC THIN FILMS;

BISMUTH; CRYSTAL MICROSTRUCTURE; ELECTRIC POWER FACTOR; FIELD EMISSION; SCANNING ELECTRON MICROSCOPY; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

THIN FILMS;

EID: 79952487511 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2010.06.019 Document Type: Conference Paper

Times cited : (22)

References (11)

1
- 67650242374
- A. Li Bassi, A. Bailini, C.S. Casari, F. Donati, A. Mantegazza, M. Passoni, V. Russo, and C.E. Bottani J. Appl. Phys. 105 2009 124307-1 124307-9
- (2009) J. Appl. Phys. , vol.105 , pp. 1243071-1243079
- Li Bassi, A.¹ Bailini, A.² Casari, C.S.³ Donati, F.⁴ Mantegazza, A.⁵ Passoni, M.⁶ Russo, V.⁷ Bottani, C.E.⁸

2
- 79952484820
- H. Kawamoto Sci. Technol. Trends 30 2009 54 69
- (2009) Sci. Technol. Trends , vol.30 , pp. 54-69
- Kawamoto, H.¹

3
- 34347332393
- J.W.G. Bos, H.W. Zandbergen, M.H. Lee, N.P. Ong, and R.J. Cava Phys. Rev. B 75 2007 195203-1 195203-9
- (2007) Phys. Rev. B , vol.75 , pp. 1952031-1952039
- Bos, J.W.G.¹ Zandbergen, H.W.² Lee, M.H.³ Ong, N.P.⁴ Cava, R.J.⁵

4
- 50849144839
- D. Bourgault, C. Giroud Garampon, N. Caillault, L. Carbone, and J.A. Ayamani Thin Solid Films 516 2008 8579 8583
- (2008) Thin Solid Films , vol.516 , pp. 8579-8583
- Bourgault, D.¹ Giroud Garampon, C.² Caillault, N.³ Carbone, L.⁴ Ayamani, J.A.⁵

5
- 33646409860
- D.H. Kim, Eungsun Byon, Gun-Hwan Lee, and Sunglae Cho Thin Solid Films 510 2006 148 153
- (2006) Thin Solid Films , vol.510 , pp. 148-153
- Kim, D.H.¹ Byon, E.² Lee, G.-H.³ Cho, S.⁴

6
- 33745604935
- X.A. Fan, J.Y. Yang, W. Zhu, H.S. Yun, R.G. Chen, S.Q. Bao, and X.K. Duan J. Alloy Compd. 420 2006 256 259
- (2006) J. Alloy Compd. , vol.420 , pp. 256-259
- Fan, X.A.¹ Yang, J.Y.² Zhu, W.³ Yun, H.S.⁴ Chen, R.G.⁵ Bao, S.Q.⁶ Duan, X.K.⁷

7
- 13444256334
- K.W. Cho, and I.H. Kim Mater. Lett. 59 2005 966 970
- (2005) Mater. Lett. , vol.59 , pp. 966-970
- Cho, K.W.¹ Kim, I.H.²

8
- 0001409402
- H. Noro, K. Sato, and H. Kagechhika J. Appl. Phys. 73 3 1993 1252 1260
- (1993) J. Appl. Phys. , vol.73 , Issue.3 , pp. 1252-1260
- Noro, H.¹ Sato, K.² Kagechhika, H.³

9
- 0141990549
- Raghuveer S. Makala, K. Jagannadham, and B.C. Sales J. Appl. Phys. 94 6 2003 3907 3918
- (2003) J. Appl. Phys. , vol.94 , Issue.6 , pp. 3907-3918
- Makala, R.S.¹ Jagannadham, K.² Sales, B.C.³

10
- 67650484678
- S.D. Kwon, B.K. Ju, S.J. Yoon, and J.S. Kim J. Electron. Mater. 38 7 2009 920 924
- (2009) J. Electron. Mater. , vol.38 , Issue.7 , pp. 920-924
- Kwon, S.D.¹ Ju, B.K.² Yoon, S.J.³ Kim, J.S.⁴

11
- 51549093127
- V. Russo, A. Bailini, M. Zamboni, M. Passoni, C. Conti, C.S. Casari, A. Li Bassi, and C.E. Bottani J. Raman Spectrosc. 39 2008 205 210
- (2008) J. Raman Spectrosc. , vol.39 , pp. 205-210
- Russo, V.¹ Bailini, A.² Zamboni, M.³ Passoni, M.⁴ Conti, C.⁵ Casari, C.S.⁶ Li Bassi, A.⁷ Bottani, C.E.⁸

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