Surface impedance approach to calculate loss in rough conductor coated with dielectric layer

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2010, Pages 790-795

  Koledintseva, Marina ^a   Koul, Amendra ^a   Zhou, Fan ^a   Drewniak, James ^a   Hinaga, Scott ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EXPRESSIONS; CLOSED FORM; CONDUCTOR LOSS; DIELECTRIC CONSTANTS; DIELECTRIC LAYER; DIELECTRIC PARAMETERS; DISSIPATION FACTORS; EPOXY LAYERS; LAYERED STRUCTURES; S PARAMETERS; STRIP LINE; SURFACE IMPEDANCES; TRAVELLING WAVES;

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETISM; ORGANIC POLLUTANTS; POLYCHLORINATED BIPHENYLS; SCATTERING PARAMETERS;

DIELECTRIC LOSSES;

EID: 79952389185     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2010.5711380     Document Type: Conference Paper

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