Material parameter extraction using Time-Domain TRL (t-TRL) measurements

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2009, Pages 280-285

  Rajagopal, Abhilash ^a   Achkir, Brice ^a   Koledintseva, Marina ^b   Koul, Amendra ^b   Drewniak, James ^b  

^a CISCO SYSTEMS   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION CONSTANTS; ATTENUATION LOSS; CALIBRATION TECHNIQUES; DATA RATES; DIELECTRIC CONSTANTS; EXTRACTION PROCEDURE; FREQUENCY DOMAINS; FREQUENCY-DEPENDENT; LOSS TANGENT; MANUFACTURING IS; MATERIAL PARAMETER EXTRACTION; MATERIAL PROPERTY; PATH ANALYSIS; PHASE CONSTANTS; PROPAGATION CONSTANT; S-PARAMETERS; SIGNAL INTEGRITY; TEST VEHICLE; TIME DOMAIN; TIME DOMAIN MEASUREMENT; TIME-DOMAIN REFLECTOMETERS; TRANSMISSION LINE; TRL CALIBRATION; VECTOR NETWORK ANALYZERS;

BANDPASS FILTERS; CALIBRATION; CURVE FITTING; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTRIC LINES; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC COMPATIBILITY; EXTRACTION; FREQUENCY DOMAIN ANALYSIS; MATERIALS PROPERTIES; PARAMETER EXTRACTION; PLASTIC MOLDS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; REFLECTOMETERS; REGRESSION ANALYSIS; SCATTERING PARAMETERS; TRANSMISSION LINE THEORY;

TIME DOMAIN ANALYSIS;

EID: 74349119079     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2009.5284640     Document Type: Conference Paper

References (12)

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