A systematic approach to PCB material characterization using time domain TRL calibration

DesignCon 2010

Volumn 1, Issue , 2010, Pages 521-537

  Khilkevich, Victor ^a   Koledintseva, Marina ^a   Sivarajan, Vysakh ^a   Liu, Dazhao ^a   Achkir, Brice ^b   Ning, Hongxia ^b   Drewniak, James L ^a  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PARAMETERS; FREQUENCY DOMAINS; MATERIAL CHARACTERIZATIONS; RECORD TIME; SAMPLING POINTS; TDR/TDT; THRU REFLECT LINES; TIME DOMAIN; TIME DOMAIN MEASUREMENT; TRL CALIBRATION; VECTOR NETWORK ANALYZERS; WAVE FORMS;

ELECTRIC NETWORK ANALYZERS; ORGANIC POLLUTANTS; POLYCHLORINATED BIPHENYLS; SCATTERING PARAMETERS;

CALIBRATION;

EID: 84866336543     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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