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Volumn 253, Issue 1, 2010, Pages
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Characterization of reactive sputtered TiO2 thin films for gas sensor applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL SENSORS;
CRYSTAL STRUCTURE;
GAS DETECTORS;
MOLECULAR ELECTRONICS;
QUARTZ;
QUARTZ CRYSTAL MICROBALANCES;
REACTIVE SPUTTERING;
REFRACTIVE INDEX;
THICKNESS MEASUREMENT;
TITANIUM DIOXIDE;
X RAY PHOTOELECTRON SPECTROSCOPY;
DIRECT CURRENT MAGNETRON SPUTTERING;
LASER ELLIPSOMETRY;
PROFILE ANALYSIS;
QUARTZ RESONATORS;
RADIO FREQUENCIES;
SENSITIVE FILMS;
SENSOR APPLICATIONS;
STRUCTURE CHANGE;
THIN FILMS;
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EID: 79952385775
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/253/1/012040 Document Type: Conference Paper |
Times cited : (33)
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References (18)
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