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Volumn 253, Issue 1, 2010, Pages

Characterization of reactive sputtered TiO2 thin films for gas sensor applications

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; CRYSTAL STRUCTURE; GAS DETECTORS; MOLECULAR ELECTRONICS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; REACTIVE SPUTTERING; REFRACTIVE INDEX; THICKNESS MEASUREMENT; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79952385775     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/253/1/012040     Document Type: Conference Paper
Times cited : (33)

References (18)
  • 15
    • 75949094186 scopus 로고
    • (Sofia: Tehnika) (in Bulgarian)
    • Manolov S and Tihchev H 1982 Generators (Sofia: Tehnika) p 128 (in Bulgarian)
    • (1982) Generators , pp. 128
    • Manolov, S.1    Tihchev, H.2
  • 18
    • 79952404157 scopus 로고    scopus 로고
    • Boyadjiev S and Rassovska M 2007 Proc. 16-th Scientific and Applied Science Conf. Electronics ET'2007 vol 4 p 121
    • (2007) , vol.4 , pp. 121
    • Boyadjiev, S.1    Rassovska, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.