Measuring grain boundary segregation using Wavelength Dispersive X-ray Spectroscopy: Further developments

Surface Science

Volumn 605, Issue 7-8, 2011, Pages 848-858

  Nowakowski, P ^a   Christien, F ^a   Allart, M ^a   Borjon Piron, Y ^a   Le Gall, R ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

AES; Auger Electron Spectroscopy; Electron Probe MicroAnalysis; EPMA; Grain boundary fracture; Grain boundary segregation; Interface; Monolayer

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DISPERSION (WAVES); ELECTRON PROBE MICROANALYSIS; ELECTRONS; FRACTURE; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MONOLAYERS; NICKEL; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS; SULFUR; SURFACE SEGREGATION; TERNARY SYSTEMS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

FRACTURE SURFACES; FURTHER DEVELOPMENT; GRAIN BOUNDARY FRACTURE; GRAIN BOUNDARY SEGREGATION; SURFACE CONCENTRATION; SURFACE CONTAMINATIONS; THE SCANNING ELECTRON MICROSCOPES (SEM); WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPIES;

SEGREGATION (METALLOGRAPHY);

EID: 79952362106     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.01.032     Document Type: Article

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