Measuring surface and grain boundary segregation using wavelength dispersive X-ray spectroscopy

Surface Science

Volumn 602, Issue 14, 2008, Pages 2463-2472

  Christien, F ^a   Le Gall, R ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

Characterization methods; EPMA; Grain boundary segregation; Monolayer; Quantification; Surface segregation; Wavelength dispersive X ray spectroscopy; WDS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DISPERSION (WAVES); ELECTRON PROBE MICROANALYSIS; FRACTURE; GRAIN BOUNDARIES; IRON ALLOYS; MONOLAYERS; NICKEL ALLOYS; SEGREGATION (METALLOGRAPHY); SULFUR; TERNARY SYSTEMS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

AUGER ELECTRON SPECTROSCOPIES (AES); CHARACTERIZATION METHODS; GRAIN BOUNDARY FRACTURE; GRAIN BOUNDARY SEGREGATION; MONOLAYER SEGREGATION; QUANTIFICATION; SURFACE CONTAMINATIONS; WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPIES;

SURFACE SEGREGATION;

EID: 48349097788     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.05.017     Document Type: Article

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