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Volumn 33, Issue 6, 2010, Pages 647-651
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XPS study of palladium sensitized nano porous silicon thin film
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Author keywords
Oxidation; Palladium; Passivation; Porous silicon; XPS
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Indexed keywords
ALUMINUM;
MONOCRYSTALLINE SILICON;
NANOSTRUCTURES;
OXIDATION;
PALLADIUM;
PASSIVATION;
SILICON;
SILICON OXIDES;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHEMICAL COMPOSITIONS;
CHEMICAL METHOD;
ELECTRO-CHEMICAL ANODIZATION;
IV CHARACTERISTICS;
LINEAR RELATIONSHIPS;
MODIFIED SURFACES;
NANO-POROUS SILICON;
RELATIVE CONCENTRATION;
POROUS SILICON;
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EID: 79952355780
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/s12034-011-0138-9 Document Type: Article |
Times cited : (14)
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References (18)
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