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Volumn 33, Issue 6, 2010, Pages 647-651

XPS study of palladium sensitized nano porous silicon thin film

Author keywords

Oxidation; Palladium; Passivation; Porous silicon; XPS

Indexed keywords

ALUMINUM; MONOCRYSTALLINE SILICON; NANOSTRUCTURES; OXIDATION; PALLADIUM; PASSIVATION; SILICON; SILICON OXIDES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79952355780     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-011-0138-9     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.