Texture control of fluorine-doped tin oxide thin film

Thin Solid Films

Volumn 519, Issue 10, 2011, Pages 3081-3085

  Kim, Chang Yeoul ^a   Riu, Doh Hyung ^b  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

^b Seoul National University of Science and Technology   (South Korea)

Author keywords

Crystal orientation; Scanning electron microscopy; Texture; Tin oxide; Transparent conducting oxide; X ray diffraction

Indexed keywords

ALUMINOBOROSILICATE GLASS; COATING SOLUTION; CRYSTAL FACE; CRYSTAL MORPHOLOGIES; CRYSTALLINE ORIENTATIONS; DEPOSITION CONDITIONS; DEPOSITION TEMPERATURES; DOPING ELEMENTS; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL RESISTIVITY; ETHYL ALCOHOLS; FLUORINE DOPED TIN OXIDE; GAS FLOWRATE; NUCLEATING SITES; OPTICAL TRANSPARENCY; ORIENTED CRYSTALS; PREFERENTIAL ORIENTATION; TIN HYDROXIDES; TRANSPARENT CONDUCTING OXIDE; TRANSPARENT CONDUCTING OXIDE FILMS; TRANSPARENT OXIDES; TWIN PLANES; WATER-BASED SOLUTIONS;

CRYSTALLITES; DIFFRACTION; ELECTRIC CONDUCTIVITY; ETHANOL; FLUORINE; NANOCOMPOSITES; OPTICAL PROPERTIES; ORGANIC POLYMERS; OXIDE FILMS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; TEXTURES; THIN FILMS; TIN; TIN OXIDES; VAPOR DEPOSITION; X RAY DIFFRACTION;

CRYSTAL ORIENTATION;

EID: 79952310360     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.096     Document Type: Article

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