Characterization of negative refraction with multilayered mushroom-type metamaterials at microwaves

Journal of Applied Physics

Volumn 109, Issue 4, 2011, Pages

  Kaipa, Chandra S R ^a   Yakovlev, Alexander B ^a   Silveirinha, Mário G ^b  

^a UNIVERSITY OF MISSISSIPPI   (United States)

^b UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

AIR-GAPS; EXPERIMENTAL VERIFICATION; GAUSSIAN BEAM EXCITATION; INCIDENCE ANGLES; METALLIC ELEMENTS; MODEL RESULTS; MULTI-LAYERED; NEGATIVE REFRACTIONS; PATCH ARRAYS; PLANE WAVE; TRANSMISSION COEFFICIENTS; TRANSMITTED WAVES; TYPE STRUCTURES; WIRE MEDIUM;

ELECTRONIC EQUIPMENT; FREQUENCY BANDS; GAUSSIAN BEAMS; HOMOGENIZATION METHOD; LIGHT REFRACTION; METALLIC COMPOUNDS; REFRACTION;

METAMATERIALS;

EID: 79952147378     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3549129     Document Type: Article

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