All-angle negative refraction and imaging in a bulk medium made of metallic nanowires in the visible region

Optics Express

Volumn 16, Issue 20, 2008, Pages 15439-15448

  Liu, Yongmin ^a   Bartal, Guy ^a   Zhang, Xiang ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DEVICES; LIGHT PROPAGATION; LIGHT REFRACTION; PHOTONIC DEVICES; REFRACTION;

BROAD FREQUENCY RANGE; DIELECTRIC MATRIXES; DISPERSION DIAGRAMS; EFFECTIVE PERMITTIVITY; INCIDENT WAVELENGTH; METALLIC NANOWIRES; NEGATIVE REFRACTIONS; TRANSVERSE MAGNETIC WAVES;

NANOWIRES;

METAL NANOPARTICLE; NANOWIRE;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; LIGHT; MATERIALS TESTING; OPTICS; RADIATION; STATISTICAL MODEL; SURFACE PLASMON RESONANCE;

EQUIPMENT DESIGN; LIGHT; MATERIALS TESTING; METAL NANOPARTICLES; MODELS, STATISTICAL; NANOWIRES; OPTICS; RADIATION; SURFACE PLASMON RESONANCE;

EID: 53249086473     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.015439     Document Type: Article

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