Nondestructive ion trap mass analysis at high pressure

Analytical Chemistry

Volumn 83, Issue 3, 2011, Pages 685-689

  Xu, Wei ^a   Maas, Jeffrey B ^b   Boudreau, Frank J ^c   Chappell, William J ^b   Ouyang, Zheng ^a,b,c  

^a PURDUE UNIVERSITY   (United States)

^b Department of Electrical and Computer Engineering ^*  (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT MEASUREMENTS; DIPOLAR EXCITATION; HIGH PRESSURE; ION MOTIONS; ION TRAPS; MASS ANALYSIS; NARROW BANDS; NON DESTRUCTIVE; SECULAR MOTION; TANDEM MASS SPECTROMETRY;

ELECTRIC CURRENT MEASUREMENT; FOURIER TRANSFORMS; MASS SPECTROMETRY;

IONS;

COCAINE;

ARTICLE; FOURIER ANALYSIS; INSTRUMENTATION; MASS SPECTROMETRY; METHODOLOGY; PRESSURE;

COCAINE; FOURIER ANALYSIS; MASS SPECTROMETRY; PRESSURE;

EID: 79952127453     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac1027808     Document Type: Article

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