Halo ion trap mass spectrometer

Analytical Chemistry

Volumn 79, Issue 7, 2007, Pages 2927-2932

  Austin, Daniel E ^a   Wang, Miao ^a   Tolley, Samuel E ^d   Maas, Jeffrey D ^b   Hawkins, Aaron R ^b   Rockwood, Alan L ^e   Tolley, H Dennis ^c   Lee, Edgar D ^d   Lee, Milton L ^a  

^a Brigham Young University   (United States)

^b Department of Electrical and Computer Engineering   (United States)

^c BRIGHAM YOUNG UNIVERSITY   (United States)

^d Palmar Technologies   (United States)

^e ARUP INSTITUTE FOR CLINICAL AND EXPERIMENTAL PATHOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CERAMIC MATERIALS; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRODES; IONIZATION; MICROFABRICATION; PLATES (STRUCTURAL COMPONENTS);

CONCENTRIC RING ELECTRODES; HALO ION TRAPS; RADIO FREQUENCY POTENTIALS; TOROIDAL GEOMETRY;

MASS SPECTROMETERS;

ARTICLE; ELECTRODE; GEOMETRY; ION TRAP MASS SPECTROMETRY; MASS SPECTROMETER; RADIOFREQUENCY; TECHNOLOGY;

EID: 34247163152     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac062155g     Document Type: Article

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