Ion Trap Mass Analysis at High Pressure: A Theoretical View

Journal of the American Society for Mass Spectrometry

Volumn 20, Issue 11, 2009, Pages 2144-2153

  Xu, Wei ^a   Song, Qingyu ^b   Smith, Scott A ^b   Chappell, William J ^a   Ouyang, Zheng ^a,c  

^a Purdue University   (United States)

^b PURDUE UNIVERSITY   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL DISCHARGES; ELEVATED PRESSURE; EXPERIMENTAL DATA; HIGH PRESSURE; ION DETECTION; ION TRAPPING; ION TRAPS; MASS ANALYSIS; MASS ANALYZERS; PRESSURE RANGES; QUADRUPOLE ION TRAPS; STORAGE DEVICES;

ELECTRIC DISCHARGES; MASS SPECTROMETRY;

IONS;

ARTICLE; CONTROLLED STUDY; EXCITATION; ION TRAP MASS SPECTROMETRY; MASS SPECTROMETER; MOLECULAR DYNAMICS; PREDICTION; PRESSURE GRADIENT; TANDEM MASS SPECTROMETRY; THEORETICAL STUDY;

ATMOSPHERIC PRESSURE; GASES; IONS; MASS SPECTROMETRY; MODELS, THEORETICAL;

EID: 70349770894     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jasms.2009.06.019     Document Type: Article

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