Mixed-signal organic integrated circuits in a fully photolithographic dual threshold voltage technology

IEEE Transactions on Electron Devices

Volumn 58, Issue 3, 2011, Pages 865-873

  Nausieda, Ivan ^a   Ryu, Kevin Kyungbum ^a   He, David Da ^a   Akinwande, Akintunde Ibitayo ^a   Bulovic, Vladimir ^a   Sodini, Charles G ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Comparators; digital integrated circuits; inverters; mixed analogdigital integrated circuits; operational amplifiers (op amps); organic compounds; thin film transistors (TFTs)

Indexed keywords

COMPARATORS; DIGITAL LOGIC; DUAL THRESHOLD VOLTAGE; DYNAMIC COMPARATORS; FLEXIBLE SUBSTRATE; GATE METALS; INVERTERS; LOW PROCESSING TEMPERATURE; MIXED ANALOGDIGITAL INTEGRATED CIRCUITS; MIXED SIGNAL; NOISE MARGINS; OFFSET VOLTAGE; ORGANIC INTEGRATED CIRCUITS; ORGANIC TECHNOLOGIES; PATTERNING TECHNIQUES; RAIL-TO-RAIL; STAGE RING OSCILLATORS; THIN-FILM TRANSISTORS (TFTS); TWO STAGE;

ANALOG CIRCUITS; BANDPASS AMPLIFIERS; COMPARATORS (OPTICAL); DIFFERENTIAL AMPLIFIERS; INTEGRATED CIRCUITS; OPERATIONAL AMPLIFIERS; ORGANIC COMPOUNDS; OSCILLATORS (ELECTRONIC); PROCESSING; THIN FILM CIRCUITS; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

DIGITAL INTEGRATED CIRCUITS;

EID: 79952043613     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2011.2105489     Document Type: Article

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