Determination of trace elements in silicon powder using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Journal of Analytical Atomic Spectrometry

Volumn 26, Issue 3, 2011, Pages 586-592

  Hsiao, Po Kai ^a   Jiang, Shiuh Jen ^a   Sahayam, A C ^b  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b National Centre for Compositional Characterisation of Materials   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTES; DESOLVATION; ELECTROTHERMAL VAPORIZATION; ETV-ICP-MS; ION SIGNALS; MATRIX COMPONENTS; METHOD DETECTION LIMITS; OPERATING CONDITION; PNEUMATIC NEBULIZATION; PURE SILICON; SILICON POWDERS; SILICON SAMPLES; SLURRY SAMPLING; SOLAR GRADE SILICONS; SPECTRAL INTERFERENCE; STANDARD ADDITION; STANDARD ADDITION CALIBRATION; ULTRASONIC SLURRY SAMPLING; VAPORIZATION TEMPERATURE;

ALUMINUM; CITRIC ACID; ELECTROMAGNETIC INDUCTION; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LEAD; MASS SPECTROMETERS; SPECTROMETRY; TRACE ANALYSIS; TRACE ELEMENTS; ULTRASONIC APPLICATIONS; VAPORIZATION; ZINC;

SILICON;

EID: 79951916004     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c0ja00203h     Document Type: Article

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