Elemental analysis of silicon based minerals by ultrasonic slurry sampling electrothermal vaporisation ICP-MS

Talanta

Volumn 68, Issue 3, 2006, Pages 869-875

  Rodríguez, Pablo Fernández ^a   Marchante Gayón, Juan Manuel ^b   Sanz Medel, Alfredo ^b  

^a Instituto Nacional de Silicosis   (Spain)

^b UNIVERSITY OF OVIEDO   (Spain)

Author keywords

Electrothermal vaporisation; ICP MS; Silicate based minerals; Ultrasonic slurry sampling

Indexed keywords

INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; SILICON; STATISTICAL METHODS; VAPORIZATION;

ELECTROTHERMAL VAPORIZATION; ICP-MS; SILICATE BASED MINERALS; ULTRASONIC SLURRY SAMPLING;

SLURRIES;

EID: 30144446117     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2005.06.006     Document Type: Article

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