Thickness-dependent structural and optical properties of VO2 thin films

Japanese Journal of Applied Physics

Volumn 50, Issue 2, 2011, Pages

  Ma, Jianwei ^a,b   Xu, Gang ^a   Miao, Lei ^a   Tazawa, Masato ^c   Tanemura, Sakae ^d  

^a GUANGZHOU INSTITUTE OF ENERGY CONVERSION   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

C-PLANE SAPPHIRE; FILM GROWTH MODE; INITIAL STAGES; ISLAND CRYSTALS; ISLAND GROWTH; PHASE TRANSITION TEMPERATURES; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL DEFECT; TEMPERATURE REDUCTION;

OPTICAL PROPERTIES; PHASE TRANSITIONS; THICK FILMS; THIN FILMS;

FILM GROWTH;

EID: 79951914130     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.020215     Document Type: Article

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