Automatic classification of bridge defects

Proceedings - International Test Conference

Volumn , Issue , 2010, Pages

  Nelson, Jeffrey E ^a   Tam, Wing Chiu ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECISION TREES;

AUTOMATIC CLASSIFICATION; FABRICATED CHIPS; HIGH-ACCURACY; LOGIC DIAGNOSIS; PHYSICAL PROXIMITY; RELEVANT FEATURES; SCAN TESTS; TEST DATA;

DEFECTS;

EID: 79951616785     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2010.5699231     Document Type: Conference Paper

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