Caustic imaging of gallium droplets using mirror electron microscopy

Ultramicroscopy

Volumn 111, Issue 5, 2011, Pages 356-363

  Kennedy, S M ^a   Zheng, C X ^a   Tang, W X ^a   Paganin, D M ^a   Jesson, D E ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Caustic imaging; Contact angle; Ga droplets; GaAs; Mirror electron microscopy (MEM)

Indexed keywords

CAUSTIC IMAGING; FIELD DISTORTIONS; FOCUS SERIES; GA DROPLETS; GAAS; GAAS(001); IMAGE CONTRASTS; IMAGING PLANE; MIRROR ELECTRON MICROSCOPIES; MIRROR ELECTRON MICROSCOPY (MEM); OBJECTIVE LENS; POTENTIAL VARIATIONS; SURFACE FEATURE; TRAJECTORY METHOD;

CONTACT ANGLE; DROPS; ELECTRIC FIELDS; ELECTRON MICROSCOPY; ELECTRONS; GALLIUM ALLOYS; GALLIUM ARSENIDE; MIRRORS; SEMICONDUCTING GALLIUM;

SURFACE TOPOGRAPHY;

GALLIUM;

ARTICLE; CONTACT ANGLE; ELECTRIC FIELD; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MATHEMATICAL MODEL; MIRROR ELECTRON MICROSCOPY; MOLECULAR IMAGING; PROCESS DESIGN; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 79951570301     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.019     Document Type: Article

References (48)

1. Luk'yanov A.E., Spivak G.V., Gvozdover R.S. Sov. Phys. Usp. 1974, 16:529. 10.1070/PU1974v016n04ABEH005299.
2. A.B. Bok, in: S. Amelinckx, R. Gevers, J. Van Landuyt (Eds.), Diffraction and Imaging Techniques in Material Science, second rev. ed., North-Holland, Amsterdam, 1978, pp. 761-788.
3. Dupuy J.C., Sibai A., Vilotitch B. Surf. Sci. 1984, 147:191. 10.1016/0039-6028(84)90175-4.
4. Slezák J., Ondřejčk M., Chvoj Z., Cháb V., Conrad H., Heun S., Schmidt Th., Ressel B., Prince K.C. Phys. Rev. B 2000, 61:16121. 10.1103/PhysRevB.61.16121.
5. Shimakura T., Takahashi Y., Sugaya M., Ohnishi T., Hasegawa M., Ohta H. Microelectron. Eng. 2008, 85:1811. 10.1016/j.mee.2008.05.018.
6. Nepijko S.A., Schönhense G. J. Microsc. 2010, 238:90. 10.1111/j.1365-2818.2009.03340.x.
7. Hilner E., Zakharov A.A., Schulte K., Kratzer P., Andersen J.N., Lundgren E., Mikkelsen A. Nano Lett. 2009, 9:2710. 10.1021/nl9011886.
8. Tersoff J., Jesson D.E., Tang W.X. Science 2009, 324:236. 10.1126/science.1169546.
9. Tersoff J., Jesson D.E., Tang W.X. Phys. Rev. Lett. 2010, 105:035702. 10.1103/PhysRevLett.105.035702.
10. Barnett M.E., Nixon W.C. J. Sci. Instrum. 1967, 44:893. 10.1088/0950-7671/44/11/302.
11. Świe{ogonek}ch W., Rausenberger B., Engel W., Bradshaw A.M., Zeitler E. Surf. Sci. 1993, 294:297. 10.1016/0039-6028(93)90116-2.
12. Bauer E. Surf. Rev. Lett. 1998, 5:1275. 10.1142/S0218625X98001614.
13. Kan H.-C., Phaneuf R.J. J. Vac. Sci. Technol. B 2001, 19:1158. 10.1116/1.1385688.
14. Nepijko S.A., Sedov N.N., Schönhense G. J. Microsc. 2001, 203:269. 10.1046/j.1365-2818.2001.00895.x.
15. Speake C.C., Trenkel C. Phys. Rev. Lett. 2003, 90:160403. 10.1103/PhysRevLett.90.160403.
16. Barnett M.E., Nixon W.C. Optik 1967, 26:310.
17. Hermans A.J., Petterson J.A. J. Eng. Math. 1970, 4:141. 10.1007/BF01535086.
18. Kennedy S.M., Jesson D.E., Morgan M.J., Smith A.E., Barker P.F. Phys. Rev. A 2006, 74:044701. 10.1103/PhysRevA.74.044701.
19. Godehardt R. Adv. Imag. Electron Phys. 1995, 94:81. 10.1016/S1076-5670(08)70144-7.
20. Nepijko S.A., Sedov N.N. Adv. Imag. Electron Phys. 1997, 102:273. 10.1016/S1076-5670(08)70125-3.
21. Nepijko S.A., Gloskovskii A., Sedov N.N., Schönhense G. J. Microsc. 2003, 211:89. 10.1046/j.1365-2818.2003.01199.x.
22. Rempfer G.F., Griffith O.H. Ultramicroscopy 1992, 47:35. 10.1016/0304-3991(92)90184-L.
23. Sedov N.N. J. Microsc. Paris 1970, 9:1.
24. Someya T., Kobayashi J. Phys. Status Solidi (a) 1974, 26:325. 10.1002/pssa.2210260134.
25. Kennedy S.M., Zheng C.X., Tang W.X., Paganin D.M., Jesson D.E. Proc. R. Soc. A 2010, 466:2857. 10.1098/rspa.2010.0093.
26. S.M. Kennedy, C.X. Zheng, W.X. Tang, D.M. Paganin, D.E. Jesson, Addendum to [25], Proc. R. Soc. A (2010) submitted for publication.
27. M.V. Berry, in: R. Balian, M. Kléman, J.-P. Poirier (Eds.), Physics of Defects, Les Houches Lecture Series Session XXXV, North-Holland, Amsterdam, 1981, pp. 453-543.
28. Nye J.F. Natural Focusing and Fine Structure of Light: Caustics and Wave Dislocations 1999, Institute of Physics Publishing, Bristol, pp. 9-11, 46-48.
29. Bauer E. Ultramicroscopy 1985, 17:51-56. 10.1016/0304-3991(85)90176-7.
30. Bauer E. Rep. Prog. Phys. 1994, 57:895. 10.1088/0034-4885/57/9/002.
31. Grant I.S., Phillips W.R. Electromagnetism 1990, John Wiley & Sons, Chichester, pp. 100-103. second ed.
32. Jackson J.D. Classical Electrodynamics 1999, John Wiley & Sons, New York, pp. 34-35, 111-112. third ed.
33. Boudjelkha M.T., Diaz J.B. Appl. Anal. 1972, 1:297. 10.1080/00036817208839020.
34. Jesson D.E., Pavlov K.M., Morgan M.J., Usher B.F. Phys. Rev. Lett. 2007, 99:016103. 10.1103/PhysRevLett.99.016103.
35. Polozhiy G.N. Equations of Mathematical Physics 1967, Hayden Book Company, New York, pp. 62-64, 149.
36. Tang W.X., Jesson D.E., Pavlov K.M., Morgan M.J., Usher B.F. J. Phys. Condens. Matter 2009, 21:314022. 10.1088/0953-8984/21/31/314022.
37. Lewis H.R. J. Appl. Phys. 1966, 37:2541. 10.1063/1.1782081.
38. Schönecker G., Spehr R., Rose H. Nucl. Instrum. Methods A 1990, 298:360. 10.1016/0168-9002(90)90638-M.
39. Wan W., Feng J., Padmore H.A., Robin D.S. Nucl. Instrum. Methods A 2004, 519:222. 10.1016/j.nima.2003.11.159.
40. F. Hecht, O. Pironneau, A. Le Hyaric, J. Morice, FreeFem++ version 3.9-0. Available from: 〈〉 (accessed June 2010). http://www.freefem.org/ff++/.
41. Press W.H., Teukolsky S.A., Vetterling W.T., Flannery B.P. Numerical Recipes, the Art of Scientific Computing 2007, Cambridge University Press, Cambridge, pp. 229-232, 907-910, and Chapter 10. third ed.
42. Born M., Wolf E. Principles of Optics 2006, Cambridge University Press, Cambridge, pp. 120-125. seventh (expanded) ed.
43. M.V. Berry, in: M.S. Soskin (Ed.), Singular Optics, SPIE Proceedings, SPIE International Society for Optical Engineering, vol. 3487, Bellingham, WA, 1998, pp. 1-5.
44. V.I. Arnol'd, in: V.I. Arnol'd, V.S. Afrajmovich, Yu.S. Il'yashenko, L.P. Shil'nikov, N. Kazarinoff (Eds.), Bifurcations and Catastrophe Theory, Springer-Verlag, Berlin, 1999 (Chapter 2).
45. Massies J., Etienne P., Dezaly F., Linh N.T. Surf. Sci. 1980, 99:121. 10.1016/0039-6028(80)90582-8.
46. Schmidt Th., Marchetto H., Lévesque P.L., Groh U., Maier F., Preikszas D., Hartel P., Spehr R., Lilienkamp G., Engel W., Fink R., Bauer E., Rose H., Umbach E., Freund H.-J. Ultramicroscopy 2010, 110:1358. 10.1016/j.ultramic.2010.07.007.
47. Spence J.C.H. High-Resolution Electron Microscopy 2003, Oxford University Press, pp. 40-41. third ed.
48. Kennedy S.M., Schofield N.E., Paganin D.M., Jesson D.E. Surf. Rev. Lett. 2009, 16:855. 10.1142/S0218625X09013402.