Combined micro-and nano-scale surface textures for enhanced near-infrared light harvesting in silicon photovoltaics

Nanotechnology

Volumn 22, Issue 9, 2011, Pages

  Chang, Chia Hua ^a   Yu, Peichen ^a   Hsu, Min Hsiang ^a   Tseng, Ping Cheng ^a   Chang, Wei Lun ^b   Sun, Wen Ching ^b   Hsu, Wei Chih ^b   Hsu, Shih Hsin ^c   Chang, Yia Chung ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION; CRYSTALLINE SILICONS; EFFECTIVE REFRACTIVE INDEX; ELECTRON BEAM EVAPORATION; EXTERNAL QUANTUM EFFICIENCY; IMPEDANCE MATCHINGS; INDIUM TIN OXIDE; LIGHT-HARVESTING; NANO-SCALE SURFACES; NEAR INFRARED; NEAR INFRARED LIGHT; NEAR-INFRARED WAVELENGTH; OPTICAL ABSORPTION; OPTICAL TRANSMISSIONS; PHOTOVOLTAICS; SCATTERING MECHANISMS; SILICON SUBSTRATES; SURFACE TEXTURES; WAFER TECHNOLOGY; WAVELENGTH RANGES;

CRYSTAL WHISKERS; INFRARED DEVICES; LIGHT REFRACTION; LIGHT TRANSMISSION; NANOSTRUCTURED MATERIALS; NANOWHISKERS; ORGANIC POLYMERS; PHOTOVOLTAIC EFFECTS; REFRACTIVE INDEX; REFRACTOMETERS; SILICON WAFERS; SOLAR CELLS; SUBSTRATES; SURFACES; TEXTURES; TIN;

SEMICONDUCTING SILICON COMPOUNDS;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; INFRARED RADIATION; INSTRUMENTATION; LIGHT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; POWER SUPPLY; RADIATION EXPOSURE; SOLAR ENERGY; SURFACE PROPERTY;

CRYSTALLIZATION; ELECTRIC POWER SUPPLIES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; LIGHT; MATERIALS TESTING; NANOSTRUCTURES; NANOTECHNOLOGY; SILICON; SOLAR ENERGY; SURFACE PROPERTIES;

EID: 79751472256     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/9/095201     Document Type: Article

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