Refractive indices of BxAl1-xN (x = 0-0.012) and ByGa1-yN (y = 0-0.023) epitaxial layers in ultraviolet region

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2691-2694

  Watanabe, Shunsuke ^a   Takano, Takayohi ^a   Jinen, Keisuke ^a   Yamamoto, Jun ^a   Kawanishi, Hideo ^a  

^a KOGAKUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALN; DEEP-UV; LIGHT REFLECTANCE; NITRIDE SEMICONDUCTORS; REFRACTIVE INDEX DIFFERENCES; SPECTRAL REGION; ULTRAVIOLET REGION; ULTRAVIOLET WAVELENGTH;

ALUMINUM; EPITAXIAL GROWTH; HETEROJUNCTIONS; NITRIDES;

REFRACTIVE INDEX;

EID: 79551689864     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303549     Document Type: Conference Paper

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