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Volumn 315, Issue 1, 2011, Pages 138-142

Diffusion length measurements in axial and radial heterostructured nanowires using cathodoluminescence

Author keywords

A1. Characterization; A1. Diffusion; A1. Nanostructures; A3. Metalorganic vapor phase epitaxy; B1. Nanomaterials; B2. Semiconducting IIIV materials

Indexed keywords

A1. CHARACTERIZATION; A1. DIFFUSION; A1. NANOSTRUCTURES; METAL-ORGANIC VAPOR PHASE EPITAXY; NANO-MATERIALS; SEMI CONDUCTING III-V MATERIALS;

EID: 79551688425     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.08.054     Document Type: Article
Times cited : (27)

References (26)
  • 22
    • 79551681282 scopus 로고    scopus 로고
    • Proceedings of the Microscopy of Semiconducting Materials XIV
    • A. Gustafsson, N. Skld, W. Seifert and L. Samuelson, Proceedings of the Microscopy of Semiconducting Materials XIV, Springer Proceedings in Physics, vol. 107, 2005, p. 463.
    • (2005) Springer Proceedings in Physics , vol.107 , pp. 463
    • A. Gustafsson1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.