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Volumn 82, Issue 1, 2011, Pages
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Optical detection system for probing cantilever deflections parallel to a sample surface
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPES;
CANTILEVER DEFLECTION;
GEOMETRICAL CONSTRAINTS;
IN-PLANE;
LIGHT BEAM;
LONG AXIS;
OPTICAL BEAM DEFLECTION;
OPTICAL DETECTION SYSTEM;
OPTICAL MICROSCOPES;
SAMPLE SURFACE;
PENDULUMS;
NANOCANTILEVERS;
ANIMAL;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
INSTRUMENTATION;
LIGHT;
LIGHT RELATED PHENOMENA;
MUSCLE FIBRIL;
RABBIT;
SURFACE PROPERTY;
ANIMALS;
LIGHT;
MICROSCOPY, ATOMIC FORCE;
MYOFIBRILS;
OPTICAL PROCESSES;
RABBITS;
SURFACE PROPERTIES;
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EID: 79551672950
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3527913 Document Type: Article |
Times cited : (21)
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References (13)
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