New analysis procedure for fast and reliable size measurement of nanoparticles from atomic force microscopy images

Journal of Nanoparticle Research

Volumn 13, Issue 1, 2011, Pages 105-113

  Boyd, Robert D ^a   Cuenat, Alexandre ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Atomic force microscopy; Electron microscopy; Image analysis; Nanoparticles; Size distribution

Indexed keywords

AFM; AFM IMAGE; ATOMIC FORCE; ENSEMBLE METHODS; HEIGHT MEASUREMENT; LATERAL DIMENSION; NANO-PARTICLE DISPERSIONS; NANO-PARTICLE PRODUCTION; SIZE MEASUREMENTS; SPHERICAL NANOPARTICLES; STRONG INTERACTION; WELL-DISPERSED;

AGGLOMERATION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; NANOPARTICLES; SIZE DISTRIBUTION;

ATOMIC FORCE MICROSCOPY;

NANOPARTICLE;

ANALYSIS; ARTICLE; ATOMIC FORCE MICROSCOPY; DISPERSION; ELECTRON MICROSCOPY; HEIGHT; MEASUREMENT; PARTICLE SIZE; PRIORITY JOURNAL; RELIABILITY; REPRODUCIBILITY;

EID: 79551589468     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-010-0007-2     Document Type: Article

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