Development of chain-folding of semicrystalline polymers in thin films: A combined ToF-SIMS and PCA analysis

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 340-343

  Lau, Yiu Ting R ^a   Weng, Lu Tao ^a   Ng, Kai Mo ^a   Chan, Chi Ming ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

flat on lamellae; fold nature; principal component analysis(PCA); time of flight secondary ion mass spectrometry (ToF SIMS)

Indexed keywords

BISPHENOL A; CHEMICAL IMAGING; CRYSTALLIZATION TEMPERATURE; ETHER LINKAGES; FLAT-ON LAMELLAE; FLEXIBLE SEGMENTS; FOLD NATURE; ION IMAGES; LAMELLAR SURFACE; LOADING ANALYSIS; PCA ANALYSIS; POLYMER CRYSTALLIZATION; PRINCIPAL COMPONENT ANALYSIS(PCA); SEMI-CRYSTALLINE POLYMER; STRUCTURAL CHANGE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

CRYSTALLIZATION; ETHERS; IONS; PHENOLS; POLYMER MELTS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SURFACE STRUCTURE; THICK FILMS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 78951484346     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3404     Document Type: Conference Paper

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