Spectroscopic ellipsometry study on the dielectric function of bulk Ti2AlN, Ti2AlC, Nb2AlC, "(Ti0.5 ,Nb0.5)2AlC, and Ti3GeC2 MAX-phases

Journal of Applied Physics

Volumn 109, Issue 1, 2011, Pages

  Mendoza Galvan A ^a,b   Rybka, M ^b   Jarrendahl K ^b   Arwin, H ^b   Magnuson, M ^b   Hultman, L ^b   Barsoum, M W ^c  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b LINKÖPING UNIVERSITY   (Sweden)

^c Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALN; COMPLEX DIELECTRIC FUNCTIONS; CRITICAL POINTS; DIELECTRIC FUNCTIONS; DIELECTRIC TENSORS; DISPERSION MODELS; ELECTRICAL RESISTIVITY; ELECTRONIC TRANSITION; HEXAGONAL COMPOUNDS; INTERBAND; LORENTZ; LOW-ENERGY RANGE; MIDINFRARED; OPTICAL RESPONSE; POLYCRYSTALLINE; ULTRAVIOLET SPECTRAL RANGE;

ELECTRIC CONDUCTIVITY;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 78751550258     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3525648     Document Type: Article

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