Synthesis and characterization of Nb2AlC thin films

Thin Solid Films

Volumn 517, Issue 9, 2009, Pages 2920-2923

  Scabarozi, T H ^a,b   Roche, J ^a   Rosenfeld, A ^a   Lim, S H ^c   Salamanca Riba, L ^c   Yong, G ^d   Takeuchi, I ^c   Barsoum, M W ^b   Hettinger, J D ^a   Lofland, S E ^a  

^a ROWAN UNIVERSITY   (United States)

^b Drexel University   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

^d TOWSON UNIVERSITY   (United States)

Author keywords

Carbides; Sputtering; Superconductivity

Indexed keywords

CARBIDES; CORUNDUM; ELECTRIC CONDUCTIVITY; FILM GROWTH; LATTICE CONSTANTS; NIOBIUM; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; SUPERCONDUCTIVITY; SURFACE ROUGHNESS; THIN FILMS;

ATOMIC FORCES; ELECTRICAL TRANSPORT MEASUREMENTS; FILM STOICHIOMETRIES; HEXAGONAL SHAPES; RESIDUAL RESISTIVITY RATIOS; ROOM-TEMPERATURE RESISTIVITIES; SCANNING ELECTRON MICROGRAPHS; SECONDARY PHASE; SELECTED AREA ELECTRON DIFFRACTIONS; SPUTTERING; SUBSTRATE TEMPERATURES; SUPERCONDUCTING TRANSITIONS; SURFACE FEATURES; SYNTHESIS AND CHARACTERIZATIONS;

SUBSTRATES;

EID: 60249102039     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.12.047     Document Type: Article

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