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Journal of Applied Physics

Volumn 108, Issue 11, 2010, Pages

Mechanism of optical degradation in microstructured InGaN light-emitting diodes

(3) Li, Z L a Li, K H a Choi, H W a

a UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; DEVICE LIFETIME; ELECTRICAL CHARACTERISTIC; LED ARRAYS; LIGHT-EXTRACTION EFFICIENCY; MICRO STRUCTURING; MICROSTRUCTURED; NOISE SPECTRA; OPTICAL DEGRADATION; OPTICAL PERFORMANCE; THROUGH CURRENT; VERTICAL CURRENT;

DEGRADATION; EXTRACTION; LIGHT EMISSION;

LIGHT EMITTING DIODES;

EID: 78751524977 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3517829 Document Type: Article

Times cited : (7)

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